#Hitachi s 4800 sem software#

Wet lab for TEM and SEM specimen preparation including incubators, ovens, balances, stereo and light microscopes, centrifuges, microcentrifuge, pH meter, hot plates, stir plates, fume hoods, etc.

#Hitachi s 4800 sem software#

Computers and software for image analysis (Photoshop, Quartz PCI, Metamorph).The energy-dispersive X-ray spectroscopy (EDX) wasmeasuredonaHoribaEMAXx-actenergy-dispersive spectroscope, which was attached to the Hitachi S-4800 system, Japan. Fully equipped B&W darkroom (including condenser enlarger, point-source enlarger) Scanning electron microscopy (SEM) images of GNAs were recorded on a Hitachi S-4800 eld emission SEM (FE-SEM) instrument with an accelerating voltage of 10 kV.Olympus PM 10AD photomicrographic system for acquisition of 35 mm photographs with Olympus BH-2 microscope.Olympus BH-2 upright compound microscope equipped for epifluorescence microscopy with a 100 watt mercury burner and 3 filter cubes (Olympus B L0910, B L0911 and B L012).Equipped with a Leica FLEXACAM C1 for digital image capture in other modes.3 PMT channels for confocal acquisition, one transmitted light PMT.2 lasers provide 5 excitation lines for confocal imaging (458 nm, 476 nm, 488 nm, 514 nm, and 543 nm).Microscope additionally equipped for DIC, phase contrast and epifluorescence microscopy. Leica TCS SP2 Confocal System installed on a Leica upright compound microscope.Oxford CT 3500 Cryo Transfer System for Hitachi H-600 TEM.

RMC CR-21 attachment for RMC MT 7000 ultramicrotomes.

Leica AFS Freeze Substitution Apparatus.

Sputter coaters (SPI, CS Mini Coater, EMITECH K575x with carbon coating attachment).

Critical point dryers (Balzers, Tousimis).

point analysis, line scan analysis and digital dot mapping capabilities.

thin window silicon drift detector (SDD) allows the detection of elements Boron and higher.exceeds manufacturerвЂ™s guaranteed resolutions of 1 nm at 15 kV, 2 nm at 1 kV, and 1.4 nm at 1 kV with beam deceleration on site (standard gold on carbon test specimen)Д®nergy-dispersive X-ray Spectrometry (EDS) Hitachi S-4800 FE-SEM is equipped with a Bruker Quantax EDS system.capable of simultaneous brightfield and darkfield STEM imaging.operable in secondary electron (SE), backscattered electron (BE), and scanning transmission electron (STEM) modes.Hitachi S-4800 Ultra High-Resolution Cold Cathode Field Emission Scanning Electron Microscope (FE-SEM)

specimen holders: standard, dual, rotational (goniometer), low background (beryllium) current metering, and cryotransfer (see below).

accelerating voltage to 100 kV in 25 kV increments.

Formal courses in scanning and transmission electron microscopy provide training to both graduate and undergraduate students.Д®quipment Electron Microscopes Hitachi H-600 Transmission Electron Microscope (TEM) Ultramicrotomes, critical point dryers, vacuum evaporators,sputter coaters and fully equipped darkrooms are also available for use. Both microscopes are equipped with EDS systems for elemental analysis. The H600 may also be operated in STEM mode. It is equipped with an Hitachi S4800 scanning electron microscope and an Hitachi H600 transmission electron microscope. The Department has a modern electron microscope facility that is used by students, faculty and staff.

Hitachi s-4800 sem